dfm covers
 
 

    Connect:ID Conference & Expo

May 1-3, 2017 

Washington, DC, USA

www.connectidexpo.com









Welcome to the 4th edition of connect:ID - with its international conference and global exhibition that focus on all aspects of identity technologies and the opportunities for their management in both the physical and digital worlds.

 

connect:ID unites solutions adopters and stakeholders from around the world to explore the development and fusion of multiple advanced identity technologies – including biometrics, secure credentials and mobile identity systems.

This event is brought to you by Science Media Partners and the International Biometrics & Identification Association (IBIA) and brings together all the players in the international identity market.


www.connectidexpo.com





 
Please make cache directory writable.
 

Submit an Article

Call for Articles

We are keen to publish new articles from all aspects of digital forensics. Click to contact us with your completed article or article ideas.

Featured Book

Learning iOS Forensics

A practical hands-on guide to acquire and analyse iOS devices with the latest forensic techniques and tools.

Meet the Authors

Noemi Kuncik

Noemi Kuncik is an IT Forensics Specialist at Grant Thornton

 

Coming up in the Next issue of Digital Forensics Magazine

Coming up in Issue 31 on sale from May 2017:


DDOS Attacks on Mobile Devices

Denial of service attacks (DoS), distributed denial of service attacks (DDoS) and reflector attacks (DRDoS) are well known and documented. More recently however we have seen that these attacks have been directed at mobile communication devices.  Read More »

Advancements in Windows Hibernation File Forensics

Brian Gerdon looks at how the windows hibernation files can be a valuable source of information for digital forensic investigators. Read More »

Subscribe today


Testing Damage Sustainability on SD Cards

A growing number of companies and agencies are now specializing in repair and recovery of data and not on the forensic examination of the data. Read More »

Every Issue
Plus the usual Competition, Book Reviews, 360, IRQ, Legal

Click here to read more about the next issue